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Tradeshows, Conferences and Courses about imaging

+ imaging workshops

Optics + Photonics 1-5.8.2010 San Diego, California, USA

Detectors and Imaging Devices:
OP217: Infrared Detectors and Focal Plane Arrays XI
Chair(s): Eustace L. Dereniak; John P. Hartke; Paul D. LeVan
Program Committee
Arvind I. D'Souza, DRS Sensors & Targeting Systems, Inc.; Sarath D. Gunapala, Jet Propulsion Lab.; John E. Hubbs, Ball Aerospace & Technologies Corp.; Herbert K. Pollehn, Army Research Lab.; Robert E. Sampson, I-Technology Applications; James A. Stobie, BAE Systems; William B. Weissbard, Teledyne Imaging Sensors

This conference is to cover 2-D Arrays from the visible (NIR) to the longwave infrared spectrum (LWIR). The detection of infrared radiation has proven to be a viable investigative tool in environmental studies and in medical, automotive, and military applications. This conference is directed toward the focal plane component of the infrared sensor system. Progress in charge transfer device technology has been rapid in both linear and two-dimensional arrays, thus continual updates to the optics community are needed. Recent developments in room temperature infrared detectors and system applications have resulted in significant interest in these topics. Various architectures such as monolithic, planar hybrid, and signal conditioning technology have been demonstrated at cryogenic temperatures for higher performance cooled IR FPAs, and therefore are tools available to researchers in various disciplines. Applications of systems containing these technologies are becoming more common, and techniques for extending the utility of these are solicited.

This conference will provide a forum for papers ranging from basic device physics to novel applications. Also there will be sessions featuring Focal Plane Signal Processing Electronics and Readout Electronics, and associated circuitry. Some sessions will emphasize Smart Signal Processing within the Readout Integrated Circuit (ROIC). We are looking for papers that demonstrate state-of-the-art in novel readout structures, on-chip signal processing, and papers that will provide information on newly designed, less expensive digital circuits for fast and ultra fast signal processors on the focal plane array.

Papers are solicited in, but are not limited to, the following areas:
    * infrared detector materials (i.e., InSb, HgCdTe, PtSi, GaAs)
    * infrared FPA (and detector) testing
    * quantum structure detectors (e.g., QWIP, stained layer)
    * smart focal planes
    * diffractive optics on FPA
    * planar hybrid arrays
    * hybrid input circuits
    * infrared sensor systems and characteristics
    * astronomical applications
    * industrial applications
    * automotive applications
    * medical applications
    * imaging spectrometer application
    * imaging polarimeter application
    * FPA data processing
    * cryogenic electronics
    * on-FPA signal processing
    * room temperature detectors
    * ROIC designs
    * smart signal processing
    * readout electronics
    * S/H on-chip
    * A/D converters per pixel, column, and array
    * up/down counter on FPA.

OP218: Infrared Detector Devices and Photoelectronic Imagers V
Chair(s): Randolph E. Longshore; Ashok K. Sood
Program Committee
Raymond S. Balcerak, Raymond S. Balcerak, LLC; Nibir K. Dhar, Army Research Lab.; Paul LoVecchio, BAE Systems; Meimei Z. Tidrow, U.S. Army Night Vision & Electronic Sensors Directorate; Priyalal S. Wijewarnasuriya, Army Research Lab.; Jimmy Xu, Brown Univ.; Sung-Shik Yoo, Northrop Grumman Electronic Systems

This conference will focus on technology achievements in the EO/IR and Photoelectronic detection and imaging and Nanotechnology based EO/IR devices and technology. The various demands for high sensitivity, low noise, improved resolution, higher low-light-level sensitivity, high-speed response, laser eye-safe imaging, and solar blind UV detector arrays, etc., have produced extensive research and development activities for devices and systems to be used for tactical, space science, analytical instrumentation, military, medical, and a host of other applications.

In addition, the conference is intended as a high-level forum bringing together scientists and engineers involved in the research, design, and development of infrared detectors and unique IR device structures including nanotechnology.

Papers are solicited for, but not limited to, the following topics:
    * nano technology based EO/IR detectors
    * nano / micro bolometers
    * detectors on large area substrates
    * HgCdTe on silicon
    * SWIR,MWIR,LWIR detectors
    * quantum well FPAs
    * heterojunction FPAs
    * strained superlattice FPAs
    * type II antimony-based superlattices FPAs
    * commercial applications
    * higher operating temperature detectors
    * avalanche photodiodes
    * very long-wavelength detectors
    * electronic readout image intensifier devices
    * innovative low noise read out circuits
    * CMOS / CCD cameras
    * single and multi-MCP detectors and imagers
    * microchannel plate technology improvements for image intensifiers
    * high-performance photomultiplier tubes
    * advanced microchannel plates
    * advanced fiber optics
    * solar blind imaging systems
    * medical image tube cameras
    * cameras for low-light-level high-definition TV
    * ultraviolet imaging systems
    * photon-counting imaging
    * lidar and ladar imaging
    * image intensifiers for military night vision systems
    * plasmonic IR applications
    * robotic vision
    * unmanned autonomous vehicle cameras
    * undersea imaging.
    * multi spectral systems

 

ESA AMICSA Workshop 2010 ESTEC (Netherlands) 05-08.09.2010

AMICSA 2010 (5-8 September 2010)

ESA is organizing the Third International Workshop on Analog and Mixed-Signal Integrated Circuits for Space Applications (AMICSA).

The Workshop will be held from September 5 to September 7 in ESTEC, The Netherlands.

This 3rd edition will include tutorials on mixed signal design for space.

SPIE Remote Sensing 2010 20-23.09.2010

Toulouse, France 20 - 23.09 2010
Centre de Congrès Pierre Baudis

SPIE Remote Sensing is the premier European meeting focused on the latest developments in remote sensing, including next-generation satellites, SAR image analysis, and LIDAR technologies.

Nach oben

photokina 2010 21-26.09.2010

Cologne Germany 21.9. - 26.9.2010
Koelnmesse
world of imaging
Die Weltleitmesse für Foto und Imaging

PHOTON Research Industry at the Parc Floral in Paris 26-29.10.2010

Held at the Parc Floral on the Esplanade du Château Vincennes in Paris, PRI - PHOTON Research Industry 2010 is the event where you will meet optics photonics leaders, forge new relationships and build your business.

This year, PRI unites OPTO (October 26-28, 2010), the European tradeshow dedicated to all optics-photonics solutions, with the annual meetings of the European Optical Société (EOS) and the CNOP (National Committee on Optics and Photonics) as well as special activities including the celebration of the laser's 50th anniversary and the awards ceremony for La Vitrine de l'Innovation.

Vision China 27-29.10.2010 Beijing, China

The 7th China International Machine Vision Exhibition and Machine Vision Technology & Application Conference (VisionChina2010) will be held on October 27-29, 2010 at China International Exhibition Center, Beijing, China. Jointly organized by Machine Vision Professional Committee under China Society of Image and Graphics and CIEC Exhibition Co., Ltd., VisionChina2010 will serve as an efficient platform for showcasing latest machine vision products and technology as well as conducting trade exchanges.

Around 100 exhibiting companies from 9 countries and regions participated in VisionChina2009, namely the United States, Germany, Japan, Singapore, Korea, Malaysia, Finland, China and Hong Kong SAR of China. The exhibiting space reached 3500 square meters. 726 registered professionals and end-users attended the conference in 21 sessions. The three-day exhibition attracted 6342 trade visitors from China, Hong Kong, Taiwan, the United States, Korea, Japan, Australia, German, Singapore, Thailand, India,Israel and Lebanon etc.

VISION 2010 09-11.11.2010

Stuttgart 09.11. - 11.11.2010
Internationale Fachmesse für industrielle Bildverarbeitung und Identifikationstechnologien

2011 International Image Sensor Workshop (IISW) June 2011 Japan

2011 International Image Sensor Workshop (IISW)
Japan June 2011


General Workshop Co-Chairs:

Nobakazu Teranishi / Panasonic

Junichi Nakamura / Aptina Imaging

Technical Program Chair:
Shoji Kawahito / Shizuoka University

Steering Committee:

Eric R. Fossum / Samsung Semiconductor R&D Center

Nobukazu Teranishi / Panasonic

Albert Theuwissen / Harvest Imaging & Delft Univ. of Technology